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University of Pennsylvania, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes

[Federal Register Volume 64, Number 16 (Tuesday, January 26, 1999)] [Notices] [Pages 3930-3931] From the Federal Register Online via the Government Publishing Office [ www.gpo.g...

[Federal Register Volume 64, Number 16 (Tuesday, January 26, 1999)]
[Notices]
[Pages 3930-3931]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 99-1774]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Pennsylvania, et al.; Notice of Consolidated 
Decision on Applications for Duty-Free Entry of Electron Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 A.M. and 5:00 P.M. in Room 4211, U.S. Department of 
Commerce, 14th and Constitution Avenue, N.W., Washington, D.C.

    Docket Number: 98-043. Applicant: University of Pennsylvania, 
Philadelphia, PA 19104-6085. Instrument: Electron Microscope, Model 
JEM-1010. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 
63 FR 50211, September 21, 1998. Order Date: July 1, 1998.

    Docket Number: 98-044. Applicant: University of North Dakota School 
of Medicine & Health Sciences, Grand Forks, ND 58202. Instrument: 
Electron Microscope, Model H-7500. Manufacturer: Hitachi, Japan. 
Intended Use: See notice at 63 FR 50211, September 21, 1998. Order 
Date: April 14, 1998.

    Docket Number: 98-045. Applicant: The University of Texas Health 
Science Center at San Antonio, San Antonio, TX 78284-7750. Instrument: 
Electron Microscope, Model EM208S. Manufacturer: N.V. Philips, Czech 
Republic. Intended Use: See notice at 63 FR 50556, September 22, 1998. 
Order Date: July 9, 1998.

    Docket Number: 98-048. Applicant: North Carolina State University, 
Raleigh, NC 27695. Instrument: Electron Microscope, Model JEM-2010F. 
Manufacturer: JEOL Ltd., Japan.

[[Page 3931]]

Intended Use: See notice at 63 FR 58368, October 30, 1998. Order Date: 
August 13, 1998.

    Docket Number: 98-055. Applicant: Mount Sinai School of Medicine, 
New York, NY 10029. Instrument: Electron Microscope and Accessories, 
Model H-7500. Manufacturer: Hitachi Scientific Instruments, Japan. 
Intended Use: See notice at 63 FR 63292, November 12, 1998. Order Date: 
June 30, 1998.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is a conventional 
transmission electron microscope (CTEM) and is intended for research or 
scientific educational uses requiring a CTEM. We know of no CTEM, or 
any other instrument suited to these purposes, which was being 
manufactured in the United States either at the time of order of each 
instrument or at the time of receipt of application by the U.S. Customs 
Service.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 99-1774 Filed 1-25-99; 8:45 am]
BILLING CODE 3510-DS-P


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64 FR 3930

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“University of Pennsylvania, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes,” thefederalregister.org (January 26, 1999), https://thefederalregister.org/documents/99-1774/university-of-pennsylvania-et-al-notice-of-consolidated-decision-on-applications-for-duty-free-entry-of-electron-microsc.