University of Hawaii, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Scientific Instruments

[Federal Register Volume 64, Number 16 (Tuesday, January 26, 1999)]
[Notices]
[Pages 3931-3932]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 99-1776]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Hawaii, et al.; Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Scientific Instruments

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be 
viewed between 8:30 A.M. and 5:00 P.M. in Room 4211, U.S. Department of 
Commerce, 14th and Constitution Avenue, N.W., Washington, D.C.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instruments described below, 
for such purposes as each is intended to be used, is being manufactured 
in the United States.
    Docket Number: 98-058. Applicant: University of Hawaii, Honolulu, 
HI 96822. Instrument: Directional Wave Buoy. Manufacturer: Datawell bv, 
The Netherlands. Intended Use: See notice at 63 FR 65174, November 25, 
1998. Reasons: The foreign instrument provides (1) capability for long-
term deployment over deep water in the open ocean for measuring 
directional waves, (2) real time data access through telemetry to 
onshore locations and (3) compatibility with similar research projects 
in this area. Advice received from: Two domestic manufacturers of 
similar equipment, July 2, 1998.
    Docket Number: 98-060. Applicant: Iowa State University of Science 
& Technology, Ames, IA 50011-3616. Instrument: Variable Temperature 
Scanning Tunneling Microscope. Manufacturer: Omicron Vakuum Physik, 
Germany. Intended Use: See notice at 63 FR 69264, December 16, 1998. 
Reasons: The foreign instrument provides (1) precise control of the 
temperature of the sample and the STM scanner over a range of 25 deg. K 
to 750 deg. K, (2) deposition of metal within the microscope and (3) 
continuous imaging of the sample during deposition. Advice received 
from: A domestic manufacturer of similar equipment, August 25, 1998.
    Domestic manufacturers of similar equipment advise that (1) the 
capabilities of each of the foreign instruments described above are 
pertinent to each applicant's intended purpose and (2) they know of no 
domestic instrument or apparatus of equivalent scientific value for the 
intended use of each instrument (comparable cases).

[[Page 3932]]

    We know of no other instrument or apparatus being manufactured in 
the United States which is of equivalent scientific value to either of 
the foreign instruments.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 99-1776 Filed 1-25-99; 8:45 am]
BILLING CODE 3510-DS-P