80 FR 65984 - Application(s) for Duty-Free Entry of Scientific Instruments
DEPARTMENT OF COMMERCE
International Trade Administration Federal Register Volume 80, Issue 208 (October 28, 2015)
International Trade Administration
Federal Register Volume 80, Issue 208 (October 28, 2015)
| Page Range | 65984-65985 | |
| FR Document | 2015-27459 |
[Federal Register Volume 80, Number 208 (Wednesday, October 28, 2015)] [Notices] [Pages 65984-65985] From the Federal Register Online [www.thefederalregister.org] [FR Doc No: 2015-27459] ----------------------------------------------------------------------- DEPARTMENT OF COMMERCE International Trade Administration Application(s) for Duty-Free Entry of Scientific Instruments Pursuant to Section 6(c) of the Educational, Scientific and Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments on the question of whether instruments of equivalent scientific value, for the purposes for which the instruments shown below are intended to be used, are being manufactured in the United States. Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations and be postmarked on or before November 17, 2015. Address written comments to Statutory Import Programs Staff, Room 3720, U.S. Department of Commerce, Washington, DC 20230. Applications may be examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of Commerce in Room 3720. Docket Number: 15-029. Applicant: University of California, Irvine, 816 F Engineering Tower, Irvine, CA 92697-2575. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument will be used to determine nanoparticle size, crystal structure, interface and defect structure, surface structure, composition, electronic state, bad-gap, cell structure, magnetic domain structure, 3D-structure and phase transformation of various materials such as metals, ceramics, semiconductors, superconductors, polymers and cells. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: June 12, 2015. Docket Number: 15-031. Applicant: University of California, Irvine, 816 F Engineering Tower, Irvine, CA 92697-2575. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument will be used to determine nanoparticle size, crystal structure, interface and defect structure, surface structure, composition, electronic state, bad-gap, cell structure, magnetic domain structure, 3D-structure and phase transformation of various materials such as metals, ceramics, semiconductors, superconductors, polymers and cells. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: June 12, 2015. Docket Number: 15-035. Applicant: Drexel University, 3141 Chestnut Street, Philadelphia, PA 19104. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument will be used to understand the structure of metal alloys, polymers, ceramics, semiconductors and biological structures and relate this to the material performance by obtaining structural and morphological information about the materials using electron diffraction, bright field and dark field imaging. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: July 20, 2015. Docket Number: 15-036. Applicant: The Trustees of Princeton University, 701 Carnegie Center, Princeton, NJ 08540. Instrument: Electron Microscope. Manufacturer: FEI Czech Republic s.r.o., Czech Republic. Intended Use: The instrument will be used for a wide range of applications including microstructural and chemical analysis of the first hydration products of cement, using samples prepared by supercritical drying, to elucidate the process of strength development and identify the effects of additives on the kinetics and microstructure, and the structural analysis of non-conducting nanowires used as gas sensors. Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: July 20, 2015. Docket Number: 15-037. Applicant: The Trustees of Princeton University, 701 Carnegie Center, Princeton, NJ 08540. Instrument: Electron Microscope. Manufacturer: FEI Electron Optics BV, the Netherlands. Intended Use: The instrument will be used for research such as the interfacial atomic structure of ferromagnetic insulator- topological insulator heterostructures, using FIB prepared thin cross- sections, to elucidate the temperature effect on near-stoichiometric materials which might lead to the development of spintronic devices based on the large anomalous Hall Effect, and the development and fabrication of uniformly dispersed nanoparticle-doped chalcogenide glass. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: July 30, 2015. Docket Number: 15-038. Applicant: South Dakota State University, 1400 North Campus Drive, Agricultural and Biosystems Engineering Box 2120, South Dakota State University, Brookings, South Dakota 57007. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument will be used to develop techniques for stronger, lighter and cheaper next generation wind turbine blades by characterizing internal and interface structure of nano-fiber enhanced composites, as well as other research. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: August 3, 2015. Docket Number: 15-039. Applicant: University of Texas Southwestern Medical Center, 5323 Harry Hines Blvd., Dallas, TX 75390. Instrument: Electron Microscope. Manufacturer: FEI Company, the Netherlands. Intended [[Page 65985]] Use: The instrument will be used to learn how imaged proteins and molecules perform their cellular functions, using cryo-transmission electron microscopy. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: August 10, 2015. Docket Number: 15-040. Applicant: UT Battelle, Oak Ridge National Laboratory, One Bethel Valley Road, P.O. Box 2008, Oak Ridge, TN 37831- 6138. Instrument: Electron Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument will be used to study metals and ceramics for nuclear power applications, using transmission electron microscopy to study the evolution of defects in the crystalline structures of the materials before and after irradiation. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: August 14, 2015. Docket Number: 15-041. Applicant: University of Minnesota, 116 Tate Lab of Physics, Minneapolis, MN 55455-0149. Instrument: IVVI Measuring System with Modules. Manufacturer: Delft University of Technology, the Netherlands. Intended Use: The instrument will be used to uncover novel quantum properties of certain semiconductors or superconductors, such as InAs, GaSb or devices combining these with superconductors such As Al and Nb, using high-sensitivity electronic current and voltage measurements. Unique properties of this instrument include modular integration of pA sensitivity ammeter, required to measure very small electrical currents down to several pA, low-noise transimpedance amplifier, required to transform the electrical currents into voltage signals of a few mV that can be measured with conventional laboratory voltmeters, and low-noise digital-to-analogue converter and signal switchboxes. The entire setup is battery-operated and is programmable via an optically-decoupled input to minimize electrical noise interference from electrical power lines or other instruments. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: August 18, 2015. Docket Number: 15-042. Applicant: Purdue University, 610 Purdue Mall, West Lafayette, IN 47907. Instrument: SuperK EXTREME EXR-20 20 MHz with SuperK VARIA High 50dB with Power Lock. Manufacturer: NKT Photonics, Denmark. Intended Use: The instrument will be used to image tissue or tissue like materials with high optical scatter using Optical Diffusion Tomography (ODT), providing useful information for the study of biological and chemical processes. The instrument has a wide turning range, which is important for exciting different fluorophores of interest, providing specificity to chemical processes, a short pulse width which is important for performing time-gated measurements, high laser power which is important for obtaining a high SNR from laser light traveling through centimeters of tissue or related scattering medium, and a 20MHz repetition rate which is important for time-gated measurements given the temporal response time of tissue. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: September 4, 2015. Docket Number: 15-043. Applicant: New York Structural Biology Center, 89 Convent Ave., New York, NY 10027. Instrument: Electron Microscope. Manufacturer: FEI Co., the Netherlands. Intended Use: The instrument will be used to determine the three-dimensional structure of biological assemblies to determine the manner in which they function and the mechanisms through which they interact with other cellular components. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: August 27, 2015. Docket Number: 15-045. Applicant: University of Massachusetts Medical School, 55 Lake Avenue North, Worcester, MA 01655. Instrument: Vitrobot. Manufacturer: FEI Electron Optics, B.V., the Netherlands. Intended Use: The instrument will be used to understand the three- dimensional structure of purified proteins and complexes at the atomic level, and how this is related to their function, by freezing them, then examining them in the frozen state in an electron microscope. The instrument can precisely control the humidity at any level, and can also control the temperature of the chamber, which is essential to freeze the proteins and complexes under exactly defined conditions, which is a requirement for all of the studies. The specimen remains in the humidity-controlled environment until the instant of freezing, which is essential to prevent any evaporation of water from the specimen before freezing. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: September 15, 2015. Docket Number: 15-046. Applicant: National Institute for Occupational Safety & Health, 1095 Willowdale Rd., Room B104, Morgantown, WV 26505. Instrument: Electron Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument will be used to determine the effects of exposing animal lung tissues and cells to particles such as silica and asbestos, nanoparticles such as carbon nanotubes, Titanium Dioxide, graphene and cellulose, in order to make recommendations to industry as to how to protect workers from lung disease. Justification for Duty-Free Entry: There are no instruments of the same general category manufactured in the United States. Application accepted by Commissioner of Customs: September 28, 2015. Dated: October 20, 2015. Gregory W. Campbell, Director of Subsidies Enforcement, Enforcement and Compliance. [FR Doc. 2015-27459 Filed 10-27-15; 8:45 am] BILLING CODE 3510-DS-P
![65984 Federal Register / Vol. 80, No. 208 / Wednesday, October 28, 2015 / Notices
East-West Highway, Silver Spring, MD 3720, U.S. Department of Commerce, 08540. Instrument: Electron Microscope.
20910. Washington, DC 20230. Applications Manufacturer: FEI Czech Republic s.r.o.,
FOR FURTHER INFORMATION CONTACT:
may be examined between 8:30 a.m. and Czech Republic. Intended Use: The
Program Administrator, Dr. Nancy 5:00 p.m. at the U.S. Department of instrument will be used for a wide range
Foster Scholarship Program, National Commerce in Room 3720. of applications including
Docket Number: 15–029. Applicant: microstructural and chemical analysis
Ocean Service, Office of the Assistant
University of California, Irvine, 816 F of the first hydration products of
Administrator, 1305 East-West
Engineering Tower, Irvine, CA 92697– cement, using samples prepared by
Highway, 13th Floor, Silver Spring, MD
2575. Instrument: Electron Microscope. supercritical drying, to elucidate the
20910–3281. Manufacturer: JEOL Ltd., Japan. process of strength development and
Deputy Director of NOAA Education, Intended Use: The instrument will be identify the effects of additives on the
Educational Partnership Program and used to determine nanoparticle size, kinetics and microstructure, and the
Ernest F. Hollings Undergraduate crystal structure, interface and defect structural analysis of non-conducting
Scholarship Program, Office of structure, surface structure, nanowires used as gas sensors. Free
Education, 1315 East-West Highway, composition, electronic state, bad-gap, Entry: There are no instruments of the
10th Floor, Silver Spring, MD 20910– cell structure, magnetic domain same general category manufactured in
3281. structure, 3D-structure and phase the United States. Application accepted
Administrative Assistant, Mendy transformation of various materials such by Commissioner of Customs: July 20,
Willis, National Marine Fisheries as metals, ceramics, semiconductors, 2015.
Service Recruitment, Training, Research superconductors, polymers and cells. Docket Number: 15–037. Applicant:
Program at the University of Florida, Justification for Duty-Free Entry: There The Trustees of Princeton University,
P.O. Box 110240, Gainesville, FL 32611. are no instruments of the same general 701 Carnegie Center, Princeton, NJ
SUPPLEMENTARY INFORMATION: On category manufactured in the United 08540. Instrument: Electron Microscope.
September 17, 2015 (80 FR 55829), the States. Application accepted by Manufacturer: FEI Electron Optics BV,
Department of Commerce published a Commissioner of Customs: June 12, the Netherlands. Intended Use: The
notice in the Federal Register, entitled 2015. instrument will be used for research
‘‘Notice of Proposed Amendment to Docket Number: 15–031. Applicant: such as the interfacial atomic structure
Privacy Act System of Records: University of California, Irvine, 816 F of ferromagnetic insulator-topological
COMMERCE/NOAA–14, Dr. Nancy Engineering Tower, Irvine, CA 92697– insulator heterostructures, using FIB
Foster Scholarship Program,’’ requesting 2575. Instrument: Electron Microscope. prepared thin cross-sections, to
comments on proposed amendments to Manufacturer: JEOL Ltd., Japan. elucidate the temperature effect on near-
the system of records. No comments Intended Use: The instrument will be stoichiometric materials which might
were received in response to the request used to determine nanoparticle size, lead to the development of spintronic
for comments. By this notice, the crystal structure, interface and defect devices based on the large anomalous
Department of Commerce is adopting structure, surface structure, Hall Effect, and the development and
the proposed changes to the system as composition, electronic state, bad-gap, fabrication of uniformly dispersed
final without changes effective October cell structure, magnetic domain nanoparticle-doped chalcogenide glass.
28, 2015. structure, 3D-structure and phase Justification for Duty-Free Entry: There
Dated: October 22, 2015. transformation of various materials such are no instruments of the same general
as metals, ceramics, semiconductors, category manufactured in the United
Michael J. Toland,
superconductors, polymers and cells. States. Application accepted by
Department of Commerce, Freedom of Justification for Duty-Free Entry: There Commissioner of Customs: July 30,
Information and Privacy Act Officer.
are no instruments of the same general 2015.
[FR Doc. 2015–27426 Filed 10–27–15; 8:45 am]
category manufactured in the United Docket Number: 15–038. Applicant:
BILLING CODE 3510–22–P States. Application accepted by South Dakota State University, 1400
Commissioner of Customs: June 12, North Campus Drive, Agricultural and
2015. Biosystems Engineering Box 2120,
DEPARTMENT OF COMMERCE Docket Number: 15–035. Applicant: South Dakota State University,
Drexel University, 3141 Chestnut Street, Brookings, South Dakota 57007.
International Trade Administration
Philadelphia, PA 19104. Instrument: Instrument: Electron Microscope.
Application(s) for Duty-Free Entry of Electron Microscope. Manufacturer: Manufacturer: JEOL Ltd., Japan.
Scientific Instruments JEOL Ltd., Japan. Intended Use: The Intended Use: The instrument will be
instrument will be used to understand used to develop techniques for stronger,
Pursuant to Section 6(c) of the the structure of metal alloys, polymers, lighter and cheaper next generation
Educational, Scientific and Cultural ceramics, semiconductors and biological wind turbine blades by characterizing
Materials Importation Act of 1966 (Pub. structures and relate this to the material internal and interface structure of nano-
L. 89–651, as amended by Pub. L. 106– performance by obtaining structural and fiber enhanced composites, as well as
36; 80 Stat. 897; 15 CFR part 301), we morphological information about the other research. Justification for Duty-
invite comments on the question of materials using electron diffraction, Free Entry: There are no instruments of
whether instruments of equivalent bright field and dark field imaging. the same general category manufactured
scientific value, for the purposes for Justification for Duty-Free Entry: There in the United States. Application
mstockstill on DSK4VPTVN1PROD with NOTICES
which the instruments shown below are are no instruments of the same general accepted by Commissioner of Customs:
intended to be used, are being category manufactured in the United August 3, 2015.
manufactured in the United States. States. Application accepted by Docket Number: 15–039. Applicant:
Comments must comply with 15 CFR Commissioner of Customs: July 20, University of Texas Southwestern
301.5(a)(3) and (4) of the regulations and 2015. Medical Center, 5323 Harry Hines Blvd.,
be postmarked on or before November Docket Number: 15–036. Applicant: Dallas, TX 75390. Instrument: Electron
17, 2015. Address written comments to The Trustees of Princeton University, Microscope. Manufacturer: FEI
Statutory Import Programs Staff, Room 701 Carnegie Center, Princeton, NJ Company, the Netherlands. Intended
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![Federal Register / Vol. 80, No. 208 / Wednesday, October 28, 2015 / Notices 65985
Use: The instrument will be used to West Lafayette, IN 47907. Instrument: in the humidity-controlled environment
learn how imaged proteins and SuperK EXTREME EXR–20 20 MHz until the instant of freezing, which is
molecules perform their cellular with SuperK VARIA High 50dB with essential to prevent any evaporation of
functions, using cryo-transmission Power Lock. Manufacturer: NKT water from the specimen before
electron microscopy. Justification for Photonics, Denmark. Intended Use: The freezing. Justification for Duty-Free
Duty-Free Entry: There are no instrument will be used to image tissue Entry: There are no instruments of the
instruments of the same general or tissue like materials with high optical same general category manufactured in
category manufactured in the United scatter using Optical Diffusion the United States. Application accepted
States. Application accepted by Tomography (ODT), providing useful by Commissioner of Customs:
Commissioner of Customs: August 10, information for the study of biological September 15, 2015.
2015. and chemical processes. The instrument Docket Number: 15–046. Applicant:
Docket Number: 15–040. Applicant: has a wide turning range, which is National Institute for Occupational
UT Battelle, Oak Ridge National important for exciting different Safety & Health, 1095 Willowdale Rd.,
Laboratory, One Bethel Valley Road, fluorophores of interest, providing Room B104, Morgantown, WV 26505.
P.O. Box 2008, Oak Ridge, TN 37831– specificity to chemical processes, a Instrument: Electron Microscope.
6138. Instrument: Electron Microscope. short pulse width which is important Manufacturer: JEOL Ltd., Japan.
Manufacturer: FEI Company, Czech for performing time-gated Intended Use: The instrument will be
Republic. Intended Use: The instrument measurements, high laser power which used to determine the effects of
will be used to study metals and is important for obtaining a high SNR exposing animal lung tissues and cells
ceramics for nuclear power from laser light traveling through to particles such as silica and asbestos,
applications, using transmission centimeters of tissue or related nanoparticles such as carbon nanotubes,
electron microscopy to study the scattering medium, and a 20MHz Titanium Dioxide, graphene and
evolution of defects in the crystalline repetition rate which is important for cellulose, in order to make
structures of the materials before and time-gated measurements given the recommendations to industry as to how
after irradiation. Justification for Duty- temporal response time of tissue. to protect workers from lung disease.
Free Entry: There are no instruments of Justification for Duty-Free Entry: There Justification for Duty-Free Entry: There
the same general category manufactured are no instruments of the same general are no instruments of the same general
in the United States. Application category manufactured in the United category manufactured in the United
accepted by Commissioner of Customs: States. Application accepted by States. Application accepted by
August 14, 2015. Commissioner of Customs: September 4, Commissioner of Customs: September
Docket Number: 15–041. Applicant: 2015. 28, 2015.
University of Minnesota, 116 Tate Lab Docket Number: 15–043. Applicant:
of Physics, Minneapolis, MN 55455– New York Structural Biology Center, 89 Dated: October 20, 2015.
0149. Instrument: IVVI Measuring Convent Ave., New York, NY 10027. Gregory W. Campbell,
System with Modules. Manufacturer: Instrument: Electron Microscope. Director of Subsidies Enforcement,
Delft University of Technology, the Manufacturer: FEI Co., the Netherlands. Enforcement and Compliance.
Netherlands. Intended Use: The Intended Use: The instrument will be [FR Doc. 2015–27459 Filed 10–27–15; 8:45 am]
instrument will be used to uncover used to determine the three-dimensional BILLING CODE 3510–DS–P
novel quantum properties of certain structure of biological assemblies to
semiconductors or superconductors, determine the manner in which they
such as InAs, GaSb or devices function and the mechanisms through DEPARTMENT OF COMMERCE
combining these with superconductors which they interact with other cellular
such As Al and Nb, using high- components. Justification for Duty-Free International Trade Administration
sensitivity electronic current and Entry: There are no instruments of the [A–475–818]
voltage measurements. Unique same general category manufactured in
properties of this instrument include the United States. Application accepted Certain Pasta From Italy: Notice of
modular integration of pA sensitivity by Commissioner of Customs: August Final Results of Antidumping Duty
ammeter, required to measure very 27, 2015. Changed Circumstances Review
small electrical currents down to several Docket Number: 15–045. Applicant:
pA, low-noise transimpedance University of Massachusetts Medical AGENCY: Enforcement and Compliance,
amplifier, required to transform the School, 55 Lake Avenue North, International Trade Administration,
electrical currents into voltage signals of Worcester, MA 01655. Instrument: Department of Commerce.
a few mV that can be measured with Vitrobot. Manufacturer: FEI Electron SUMMARY: On June 23, 2015, the
conventional laboratory voltmeters, and Optics, B.V., the Netherlands. Intended Department of Commerce (Department)
low-noise digital-to-analogue converter Use: The instrument will be used to published the preliminary results of the
and signal switchboxes. The entire understand the three-dimensional changed circumstances review of the
setup is battery-operated and is structure of purified proteins and antidumping duty order on certain pasta
programmable via an optically- complexes at the atomic level, and how from Italy and preliminarily determined
decoupled input to minimize electrical this is related to their function, by that La Molisana S.p.A. (La Molisana)
noise interference from electrical power freezing them, then examining them in was not the successor-in-interest to La
lines or other instruments. Justification the frozen state in an electron Molisana Industrie Alimentari, S.p.A.
(LMI), a respondent in the investigation
mstockstill on DSK4VPTVN1PROD with NOTICES
for Duty-Free Entry: There are no microscope. The instrument can
instruments of the same general precisely control the humidity at any and several administrative reviews.1 We
category manufactured in the United level, and can also control the received comments from interested
States. Application accepted by temperature of the chamber, which is
1 See Certain Pasta from Italy: Notice of
Commissioner of Customs: August 18, essential to freeze the proteins and
Preliminary Results of Antidumping Duty Changed
2015. complexes under exactly defined Circumstances Review, 80 FR 35936 (June 23, 2015)
Docket Number: 15–042. Applicant: conditions, which is a requirement for (Preliminary Results) and accompanying
Purdue University, 610 Purdue Mall, all of the studies. The specimen remains Preliminary Decision Memorandum.
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Document Created: 2018-02-27 08:57:54
Document Modified: 2018-02-27 08:57:54
| Category | Regulatory Information | |
| Collection | Federal Register | |
| sudoc Class | AE 2.7: GS 4.107: AE 2.106: | |
| Publisher | Office of the Federal Register, National Archives and Records Administration | |
| Section | Notices | |
| FR Citation | 80 FR 65984 |
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