80 FR 44031 - International Trade Administration

DEPARTMENT OF COMMERCE

Federal Register Volume 80, Issue 142 (July 24, 2015)

Page Range44031-44031
FR Document2015-18212

Federal Register, Volume 80 Issue 142 (Friday, July 24, 2015)
[Federal Register Volume 80, Number 142 (Friday, July 24, 2015)]
[Notices]
[Page 44031]
From the Federal Register Online  [www.thefederalregister.org]
[FR Doc No: 2015-18212]


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DEPARTMENT OF COMMERCE


International Trade Administration

Idaho National Laboratory, et al.; Notice of Consolidated 
Decision on Applications for Duty-Free Entry of Electron Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5:00 
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue NW., Washington, DC.
    Docket Number: 15-005. Applicant: Idaho National Laboratory, Idaho 
Falls, ID 83415. Instrument: Electron Microscope. Manufacturer: FEI, 
Czech Republic. Intended Use: See notice at 80 FR 26896, May 11, 2015.
    Docket Number: 15-010. Applicant: Howard Hughes Medical Institute, 
Chevy Chase, MD 20815. Instrument: Electron Microscope. Manufacturer: 
JEOL Ltd., Japan. Intended Use: See notice at 80 FR 26896, May 11, 
2015.
    Docket Number: 15-011. Applicant: University of South Alabama, 
Mobile, AL 36688. Instrument: Electron Microscope. Manufacturer: FEI 
Czech Republic s.r.o., Czech Republic. Intended Use: See notice at 80 
FR 26896, May 11, 2015.
    Docket Number: 15-012. Applicant: Albert Einstein College of 
Medicine of Yeshiva University, Bronx, NY 10461. Instrument: Electron 
Microscope. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 
80 FR 26896, May 11, 2015.
    Docket Number: 15-014. Applicant: Johns Hopkins University, 
Baltimore, MD 21218. Instrument: Electron Microscope. Manufacturer: FEI 
Company, the Netherlands. Intended Use: See notice at 80 FR 26896, May 
11, 2015.
    Docket Number: 15-016. Applicant: Rutgers University, New 
Brunswick, NJ 08901. Instrument: LN Microscope. Manufacturer: Luigs 
Neumann, Germany. Intended Use: See notice at 80 FR 26896, May 1, 2015.
    Docket Number: 15-017. Applicant: City University of New York, New 
York, NY 10017. Instrument: Electron Microscope.
    Manufacturer: FEI Company, Japan. Intended Use: See notice at 80 FR 
26896, May 11, 2015.
    Docket Number: 15-018. Applicant: City University of New York, New 
York, NY 10017. Instrument: Electron Microscope. Manufacturer: FEI 
Company, Japan. Intended Use: See notice at 80 FR 26896, May 11, 2015.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: July 20, 2015.
Gregory W. Campbell,
Director, Subsidies Enforcement Office, Enforcement and Compliance.
[FR Doc. 2015-18212 Filed 7-23-15; 8:45 am]
 BILLING CODE 3510-DS-P


Current View
CategoryRegulatory Information
CollectionFederal Register
sudoc ClassAE 2.7:
GS 4.107:
AE 2.106:
PublisherOffice of the Federal Register, National Archives and Records Administration
SectionNotices
FR Citation80 FR 44031 

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