81 FR 11517 - Application(s) for Duty-Free Entry of Scientific Instruments

DEPARTMENT OF COMMERCE
International Trade Administration

Federal Register Volume 81, Issue 43 (March 4, 2016)

Page Range11517-11518
FR Document2016-04843

Federal Register, Volume 81 Issue 43 (Friday, March 4, 2016)
[Federal Register Volume 81, Number 43 (Friday, March 4, 2016)]
[Notices]
[Pages 11517-11518]
From the Federal Register Online  [www.thefederalregister.org]
[FR Doc No: 2016-04843]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before March 24, 2016. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 15-044. Applicant: University of Pittsburgh, 116 
Atwood Street, Suite 201, Pittsburgh, PA 15260. Instrument: Scios Dual 
Beam Field Emission Scanning Electron Microscope. Manufacturer: Scios, 
Czech Republic. Intended Use: The instrument will be used to reveal the 
surface and sub-surface microstructure metrics of structural materials 
such as steels, Ni-based superalloys, Al-, Ti-, Mn-base and other 
specialty alloys, functional materials based on ceramic, metal and 
semiconducting thin films, particulates and composites. Justification 
for Duty-Free Entry: There are no instruments of the same general 
category manufactured in the United States. Application accepted by 
Commissioner of Customs: December 15, 2015.
    Docket Number: 15-047. Applicant: Dana-Farber Cancer Institute, 450 
Brookline Ave., Boston, MA 02210. Instrument: Electron Microscope. 
Manufacturer: JEOL, LTD., Japan. Intended Use: The instrument will be 
used to study a wide range of biomolecules with the overall objective 
of better understanding the biological processes underlying normal and 
abnormal (cancer) biological activity. Justification for Duty-Free 
Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: December 15, 2015.
    Docket Number: 15-049. Applicant: University of Maryland College 
Park, 2125 J. M. Patterson, College Park, MD 20742. Instrument: Laser 
lithography system Photonic Professional GT and accessories. 
Manufacturer: Nanoscribe GmbH, Hermon Von Hermholtz Platz 1, Germany. 
Intended Use: The fundamental capabilities of the instrument target the 
nanoscale fabrication of complex 3-dimensional polymer components and 
systems. The instrument will be used for the characterization and 
optimization of fabrication resolution and precision for specific 
applications and device and system level characterization of components 
manufactured using the nanoscribe tool. It will be used to perform 
research into the nanoscale patterning of photoactive polymer 
materials, including epoxy-based photoresists. Unique features of this 
instrument include two photon polymerization of various UV-curable 
photoresists, two photon exposure of common positive tone photoresists, 
and the highest resolution available for a 3D printer. Justification 
for Duty-Free Entry: There are no instruments of the same general 
category manufactured in the United States. Application accepted by 
Commissioner of Customs: December 7, 2015.
    Docket Number: 15-054. Applicant: University of Connecticut Health 
Center, 263 Farmington Ave., Farmington, CT 06030. Instrument: Electron 
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: 
The instrument will be used to investigate the organization of various 
organs and tissues obtained from mice. Justification for Duty-Free 
Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: November 24, 2015.
    Docket Number: 15-056. Applicant: St. Jude Children's Research 
Hospital, 262 Danny Thomas Place, Memphis, TN 38105. Instrument: 
Electron Microscope. Manufacturer: FEI Company, Czech Republic. 
Intended Use: The instrument will be used to study cell and tissue 
cultures, model systems and human tissue biopsies. Justification for 
Duty-Free Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: December 15, 2015.
    Docket Number: 15-059. Applicant: Rutgers University, 136 
Frelinghuysen Road, Piscataway, NK 08854. Instrument: Low Temperature 
Scanning Tunneling Microscope. Manufacturer: Unisoku, Japan. Intended 
Use: The instrument will be used to prepare atomically flat and clean 
surfaces of samples with proper heat treatment, measure crystal 
surface's electronic structure with ultimate spatial and energy 
resolution, observe quantum phenomena accompanied with temperature or 
magnetic field change at the atomic scale, find the atomic origin of 
quantum phenomena in strongly correlated materials and control the 
quantum phenomena by material deposition or atom manipulation. 
Techniques will include making and maintaining ultra-high vacuum, 
lowering the temperature by using cryogenic liquids, heating of samples 
in the vacuum chamber by electron beam heating, cleaving of samples at 
low temperature, vacuum material evaporation, and scanning probe 
techniques to get electronic structures of the specimen (scanning 
tunneling microscopy, scanning tunneling spectroscopy, tip treatment or 
atom manipulation). Unique features of this instrument include 
operation temperature of lower than 5K with liquid helium, ultra high 
vacuum at 1.3x10-\8\ Pa (9.8x10-\11\ Torr), high 
magnetic field supplied superconducting magnet with a maximum 8 Tesla 
field perpendicular to the sample plane, preparation chamber with 
direct current heating up to 1300C and e-beam heating up to 1500C, IS 
40C1 Sputter Cleaning Ion Source with gas inlet package, MAN-SLT 
cooling and cleaving manipulator, and UHV multi-element miniature 
evaporator ME series. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: December 15, 
2015.
    Docket Number: 15-060. Applicant: Kent State University, 1425 
University Esplanade, Kent, OH 44242. Instrument: Electron Microscope. 
Manufacturer: FEI company, the Netherlands. Intended Use: The 
instrument will be used to characterize various kinds of solid state 
materials and fabricate nanostructures and devices. Justification for 
Duty-Free Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: December 8, 2015.


[[Page 11518]]


    Dated: February 25, 2016.
Gregory W. Campbell,
Director of Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2016-04843 Filed 3-3-16; 8:45 am]
BILLING CODE 3510-DS-P


Current View
CategoryRegulatory Information
CollectionFederal Register
sudoc ClassAE 2.7:
GS 4.107:
AE 2.106:
PublisherOffice of the Federal Register, National Archives and Records Administration
SectionNotices
FR Citation81 FR 11517 

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