81 FR 71702 - Application(s) for Duty-Free Entry of Scientific Instruments

DEPARTMENT OF COMMERCE
International Trade Administration

Federal Register Volume 81, Issue 201 (October 18, 2016)

Page Range71702-71703
FR Document2016-25173

Federal Register, Volume 81 Issue 201 (Tuesday, October 18, 2016)
[Federal Register Volume 81, Number 201 (Tuesday, October 18, 2016)]
[Notices]
[Pages 71702-71703]
From the Federal Register Online  [www.thefederalregister.org]
[FR Doc No: 2016-25173]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before November 7, 2016. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5:00 p.m. at the U.S. Department of 
Commerce in Room 3720.

    Docket Number: 15-061. Applicant: Yale School of Medicine, 333 
Cedar St., New Haven, CT 06510. Instrument: SuperK Extreme EXR-20 white 
light laser. Manufacturer: NKT Photonics, Denmark. Intended Use: The 
instrument will be used as an excitation sources for the study of 
intracellular processes and structures at super resolution. The 
experiments require a high power pulsed excitation source at a 
wavelength of 590 nm, and minimal after pulse tail and sub 100 ps pulse 
width. Justification for Duty-Free Entry: There are no instruments of 
the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: July 18, 2016.

    Docket Number: 16-002. Applicant: University of Massachusetts 
Medical School, 55 Lake Avenue North, Worcester, MA 01655. Instrument: 
Electron Microscope. Manufacturer: FEI Company, the Netherlands. 
Intended Use: The instrument will be used to understand the three-
dimensional structure of purified proteins and protein complexes at the 
atomic level, and how this is related to their function. Justification 
for Duty-Free Entry: There are no instruments of the same general 
category manufactured in the United States. Application accepted by 
Commissioner of Customs: July 18, 2016.

    Docket Number: 16-004. Applicant: Purdue University, 315 N. Grant 
St., West Lafayette, IN 47907. Instrument: SGR YAG pulsed laser. 
Manufacturer: Beamtech Optronics, Co. LTD, China. Intended Use: The 
instrument will be used for pulsed laser annealing and nanostructure 
integrated laser shock peening, to improve the microstructure of thin 
film for better electrical and optical properties. Requirements for the 
experiment include three wave lengths (355nm, 532nm, 1064nm), pulse 
energy 2J, flat hat beam, and pulse duration tunable from 10ns to 25ns. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: July 18, 2016.

    Docket Number: 16-005. Applicant: Rutgers University, 
Administrative Services Bldg. I, Rm. 300, Plant Funds, 65 Davidson 
Road, Piscataway, NJ 08854-8076. Instrument: Electron

[[Page 71703]]

Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: 
The instrument will be used to achieve sub-nanometer resolution 
structures of protein complexes, characterize interactions between 
various components of protein complexes and understand biological 
activities by imaging protein assemblies in cellular or physiologic 
conditions. Justification for Duty-Free Entry: There are no instruments 
of the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: July 14, 2016.

    Docket Number: 16-008. Applicant: California Institute of 
Technology, 1200 E. California Blvd., Pasadena, CA 91125. Instrument: 
Cryogenic Temperature Scanning Tunneling Microscope System. 
Manufacturer: Unisoku Co., LTd., Japan. Intended Use: The instrument 
will be used to investigate structural and electrical surface 
properties with atomic resolution at cryogenic temperatures (-459 
Fahrenheit--0.4 K) and high magnetic fields, at which conditions 
materials can exhibit unusual quantum properties such as topological 
superconductivity and fractionalization of charge carriers. Experiments 
to be conducted with the instrument include mapping of the local 
electronic density of states of gated nanostructures by measuring 
current--voltage curves at different points, mapping of the electron 
spin structure using scanning tips made of magnetic materials, and 
probing the size of the energy gap in topological insulators and 
topological superconductors. For this type of research an instrument 
capable of performing scanning tunneling microscopy (STM) and atomic 
force microscopy (AFM) at cryogenic temperatures and high magnetic 
fields is essential. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: July 14, 2016.

    Docket Number: 16-010. Applicant: University of California, 
Riverside, 900 University Drive, Riverside, CA 92521. Instrument: 
Electron Microscope. Manufacturer: FEI Company, the Netherlands. 
Intended Use: The instrument will be used teaching and associated 
research, including materials science, earth science and life science, 
all of which rely on the characterization of morphology and structure 
at microscopic down to atomic scale of materials and biological 
tissues. Justification for Duty-Free Entry: There are no instruments of 
the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: July 18, 2016.

    Docket Number: 16-011. Applicant: Van Andel Research Institute, 333 
Botswick Avenue NE., Grand Rapids, MI 49503. Instrument: Electron 
Microscope. Manufacturer: FEI Company, the Netherlands. Intended Use: 
The instrument will be used to computationally process images of 
protein complexes and apply averaging techniques to 3D models of 
isolated cellular components. Justification for Duty-Free Entry: There 
are no instruments of the same general category manufactured in the 
United States. Application accepted by Commissioner of Customs: June 
21, 2016.

    Docket Number: 16-012. Applicant: Van Andel Research Institute, 333 
Botswick Avenue NE., Grand Rapids, MI 49503. Instrument: Electron 
Microscope. Manufacturer: FEI, Co., the Netherlands. Intended Use: The 
instrument will be used to computationally process images of protein 
complexes and apply averaging techniques to 3D models of isolated 
cellular components. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: June 16, 2016.

    Docket Number: 16-013. Applicant: Van Andel Research Institute, 333 
Botswick Avenue NE., Grand Rapids, MI 49503. Instrument: Electron 
Microscope. Manufacturer: FEI Company, Czech Republic. Intended Use: 
The instrument will be used to computationally process images of 
protein complexes and apply averaging techniques to calculate 3D models 
of isolated cellular components. Justification for Duty-Free Entry: 
There are no instruments of the same general category manufactured in 
the United States. Application accepted by Commissioner of Customs: 
July 15, 2016.

    Docket Number: 16-014. Applicant: Iowa State University, 3616 
Administrative Services Bldg., Stange Road, Ames, Iowa 50011-3616. 
Instrument: Electron Microscope. Manufacturer: FEI Company, the 
Netherlands. Intended Use: The instrument will be used to study atom 
arrangement/motion in defects, interface, precipitate and their effect 
on property using high-resolution (scanning) electron microscopy, 
nanospectroscopy, electron diffraction, electron holography and Lorentz 
microscopy. Justification for Duty-Free Entry: There are no instruments 
of the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: July 14, 2016.

    Docket Number: 16-015. Applicant: Yale University, 2 Whitney 
Avenue, Suite 540, P.O. Box 208202, New Haven, CT 06520. Instrument: 
Electron Microscope. Manufacturer: FEI Company, the Netherlands. 
Intended Use: The instrument will be used to obtain atomic-resolution 
maps of macromolecular complexes, to obtain three-dimensional tomograms 
of cellular contents, and to observe the arrangements of organelles and 
macromolecular complexes that participate in cellular processes. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: July 18, 2016.

    Docket Number: 16-016. Applicant: State University of New York at 
Stony Brook, Research & Development Campus, Development Drive, Bldg. 
17, Stony Brook, NY 117964-6000. Instrument: Cryo-Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument will be used to image and visualize purified proteins, 
nucleic acid-protein complexes, and thin sections of biological 
materials such as cells or tissues by cryo-electron microscopy. 
Justification for Duty-Free Entry: There are no instruments of the same 
general category manufactured in the United States. Application 
accepted by Commissioner of Customs: August 24, 2016.


    Dated: October 11, 2016.
Gregory W. Campbell,
Director of Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2016-25173 Filed 10-17-16; 8:45 am]
 BILLING CODE 3510-DS-P


Current View
CategoryRegulatory Information
CollectionFederal Register
sudoc ClassAE 2.7:
GS 4.107:
AE 2.106:
PublisherOffice of the Federal Register, National Archives and Records Administration
SectionNotices
FR Citation81 FR 71702 

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