82 FR 34928 - Princeton University, et al. Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope

DEPARTMENT OF COMMERCE
International Trade Administration

Federal Register Volume 82, Issue 143 (July 27, 2017)

Page Range34928-34928
FR Document2017-15852

Federal Register, Volume 82 Issue 143 (Thursday, July 27, 2017)
[Federal Register Volume 82, Number 143 (Thursday, July 27, 2017)]
[Notices]
[Page 34928]
From the Federal Register Online  [www.thefederalregister.org]
[FR Doc No: 2017-15852]


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DEPARTMENT OF COMMERCE

International Trade Administration


Princeton University, et al. Notice of Consolidated Decision on 
Applications for Duty-Free Entry of Electron Microscope

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5:00 
p.m. in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue NW., Washington, DC.
    Docket Number: 16-023. Applicant: Princeton University, Princeton, 
NJ 08540. Instrument: Electron Microscope. Manufacturer: FEI Company, 
Czech Republic. Intended Use: See notice at 82 FR 16796-97, April 6, 
2017.
    Docket Number: 16-024. Applicant: The Hormel Institute, Austin, MN 
55912. Instrument: Electron Microscope. Manufacturer: FEI Company, the 
Netherlands. Intended Use: See notice at 82 FR 23191, May 22, 2017.
    Docket Number: 16-025. Applicant: The Hormel Institute, Austin, MN 
55912. Instrument: Electron Microscope. Manufacturer: FEI Company, 
Czech Republic. Intended Use: See notice at 82 FR 23191, May 22, 2017.
    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as this instrument is intended to be used, is being 
manufactured in the United States at the time the instrument was 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: July 24, 2017.
Gregory W. Campbell,
Director, Subsidies Enforcement, Enforcement and Compliance.
[FR Doc. 2017-15852 Filed 7-26-17; 8:45 am]
 BILLING CODE 3510-DS-P


Current View
CategoryRegulatory Information
CollectionFederal Register
sudoc ClassAE 2.7:
GS 4.107:
AE 2.106:
PublisherOffice of the Federal Register, National Archives and Records Administration
SectionNotices
FR Citation82 FR 34928 

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